Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
ISBN 13: 9781441909374
Format: Hardcover (171 pages) Publisher: Springer Published: 11 Nov 2009
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ISBN 13: 9781489983145
Format: Paperback (188 pages) Publisher: Springer Published: 03 Sep 2014